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Thin Solid Films Impact Factor 2008. Mechanics and Nanomechanics of Thin Layers. 3b the enhancement factor is 22735347 and 8944 for the non-welding Al 2O 3 welded and steel welded cathodes respectively. Thin Film Devices Sensors and Actuators. Thin Solid Films IF is decreased by a factor of 017 and approximate percentage change is -837 when compared to preceding year 2017 which shows a falling trend.
Fig4showsthe emissioncurrent stabilityof theCNTsmeasuredat. Table 1 Sputtering parameters for AlN films deposition Target-to-substrate spacing 6 cm Pressure 055 Pa Ar flow rate 5 sccm N 2 flow rate 5 sccm 0040-6090 see front matter 2008 Elsevier BV. Thin Solid Films 517 2008 986989 Corresponding author. Thin Film Devices Sensors and Actuators. 影响因子官网提供SCI期刊THIN SOLID FILMSTHIN SOLID FILMS0040-60902000-20142015及历年影响因子impactfactor专业排名论文被引频次论文收录等专业数据查询. The FN emission behavior can be examined fromthelinearityofcurvesplottinglnIV2versus1VFromtheslope of the FN plot Fig.
Thin Solid Films 517 2008 986989 Corresponding author.
Nanostructured and layered materials. Metallurgical Protective and Hard Layers. To be honest the answer is NO. The 2016-2017 Journal Impact IF of Thin Solid Films is 1879 Thin Solid Films Key Factor Analysis The 2015-2016 Journal Impact IF of Thin Solid Films is 1761 Thin Solid Films Key Factor Analysis. Thin Solid Films 517 2008 986989 Corresponding author. Surfaces Interfaces and Colloidal Behaviour.